Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Tekijä Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Tekijä Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

VLSI design proceedings of the Second International Workshop on VLSI Design ; Bangalore, India, December 15-18, 1988

Tutorial test generation for VLSI chips